# Crystalline Characterization of ZnO Nanowire and GaN Flake Using STEM-CL

> In this work, Toray Research Center introduces crystalline quality to GaN flakes and ZnO nanowires by STEM-CL.

Source: https://covalent.com/resource-library/crystalline-characterization-of-zno-nanowire-and-gan-flake-using-stem-cl/
Updated: 2026-05-04T23:23:35+00:00

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# Crystalline Characterization of ZnO Nanowire and GaN Flake Using STEM-CL

 [![Crystalline Characterization of ZnO Nanowire and GaN Flake Using STEM-CL](https://spcdn.shortpixel.ai/spio/ret_img,q_cdnize,to_auto,s_webp:avif/covalent.com/wp-content/uploads/2023/10/Crystalline-Characterization-of-ZnO-Nanowire-and-GaN-Flake-using-STEM-CL.jpg)](https://covalent.com/wp-content/uploads/2025/09/trc-sman-en-202109-dc-14-p02325.pdf)

Dec 12, 2021

STEM-CL is an analytical tool which is similar to well-known techniques: SEM-CL, PL, and EELS. We developed new STEM-CL apparatus. In this work, we introduce crystalline quality to GaN flakes and ZnO nanowires by STEM-CL.

[Click here to download the Whitepaper](https://covalent.com/wp-content/uploads/2025/09/trc-sman-en-202109-dc-14-p02325.pdf)

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