# Key Principles of Lamella Sample Preparation for STEM

> Video walkthroughs of key methods and considerations for preparing high-quality S/TEM lamella using a DualBeam FIB-SEM microscope.

Source: https://covalent.com/resource-library/key-principles-of-lamella-sample-preparation-for-stem/
Updated: 2026-05-12T22:36:45+00:00

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# Key Principles of Lamella Sample Preparation for STEM

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April 25, 2022

These videos are excerpted from a [Covalent Academy](https://academy.covalentmetrology.com) webinar episode presented by Ryan Dudschus, a Senior Metrology Engineer in Covalent’s electron microscopy group. His webinar presentation explains the preparation techniques used to extract high-quality lamella for [(scanning)](https://covalent.com/techniques/electron-microscopy/scanning-transmission-electron-microscopy-stem/)[transmission electron microscopy](https://covalent.com/techniques/electron-microscopy/transmission-electron-microscopy-tem/) analysis.

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