# R&D Applications of Spectroscopic Ellipsometry > In this episode, Dr. Jianing Sun (from J.A. Woollam) explains the operating principles and theory of Spectroscopic Ellipsometry before demonstrating its broad applications in thin film research and development across industries including semiconductors, displays, optical devices, photovoltaics, biotechnology, chemistry, and advanced materials. This webinar introduces an increasingly powerful and fast-growing optical technique for thin-film characterization: Spectroscopic […] Source: https://covalent.com/webinars/rd-applications-of-spectroscopic-ellipsometry/ Updated: 2026-01-07T14:59:31+00:00 --- ![](https://spcdn.shortpixel.ai/spio/ret_img,q_cdnize,to_auto,s_webp:avif/covalent.com/wp-content/uploads/2024/10/spectroscopic-ellipsometry.jpg) ![](https://spcdn.shortpixel.ai/spio/ret_img,q_cdnize,to_auto,s_webp:avif/covalent.com/wp-content/uploads/2024/10/spectroscopic-ellipsometry.jpg) # R&D Applications of Spectroscopic Ellipsometry 2024-10-17 11:00:00 | 2026-05-31 02:24:55 October 17 2024, 11:00 am PT | 60 min In this episode, Dr. Jianing Sun (from J.A. Woollam) explains the operating principles and theory of Spectroscopic Ellipsometry before demonstrating its broad applications in thin film research and development across industries including semiconductors, displays, optical devices, photovoltaics, biotechnology, chemistry, and advanced materials. This webinar introduces an increasingly powerful and fast-growing optical technique for thin-film characterization: [Spectroscopic Ellipsometry](https://covalent.com/techniques/optical-analysis/spectroscopic-ellipsometry/). Watch now to learn how Ellipsometry unlocks critical R&D insights for real-time process control and property monitoring. ## Who should watch? This webinar has been designed for researchers and engineers looking to advance their knowledge and skills in thin film analysis for product R&D. That said, anyone interested in learning more about optical characterization methods and the latest techniques in thin film analysis will benefit from joining! ## What you’ll learn about Spectroscopic Ellipsometry (SE): 1. How does this technique work? 2. What are the technique’s advantages and disadvantages? 3. What properties can it measure or help to analyze? 4. What are some examples of [Spectroscopic Ellipsometry](https://covalent.com/techniques/optical-analysis/spectroscopic-ellipsometry/) applications in industry R&D? 5. What information can be gained through *in-situ* and *dynamic*Ellipsometry techniques? 6. When is Ellipsometry particularly useful, and why? What samples and applications is it best suited for? ## Ellipsometry: Giving Researchers the Flexibility to Look at Thin Films in a New Light Spectroscopic Ellipsometry is a nondestructive optical technique used to analyze thin films ranging from sub-nanometers up to tens of microns thick. It is sensitive to film thickness, uniformity, bandgap energy, alloy composition, anisotropy, and more. By performing these measurements dynamically and in real-time, experts can gain an even deeper understanding of processes and evolving physical and optical properties of materials. Its growing popularity in the semiconductor, biotech, chemistry, and electronics industries evinces its versatility and utility. Watch this webinar to review common and advanced applications of Ellipsometry, including *in-situ*processes and dynamic measurements. Speakers: Jianing Sun, PhD Applications Engineer, J.A. Woollam Co. Dr. Jianing Sun joined the J.A. Woollam Company in 2008 and has since worked as an applications engineer for over 16 years. She has an extensive track record in developing ellipsometry techniques for thin-film research, particularly focusing on semiconductors and materials science. 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