# Unlock the Power of ToF-SIMS > In this episode, Dr. Tatyana Kravchuk and Dr. Lyle Gordon explain the operating principles and theory of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and demonstrate its broad applications in surface investigation across industries, including semiconductors, optical devices, paints, chemistry, and advanced materials. You will gain an understanding of how ToF-SIMS can resolve chemical compositions, molecular […] Source: https://covalent.com/webinars/unlock-the-power-of-tof-sims/ Updated: 2026-01-07T14:58:47+00:00 --- ![](https://spcdn.shortpixel.ai/spio/ret_img,q_cdnize,to_auto,s_webp:avif/covalent.com/wp-content/uploads/2025/02/tof-sims-webinar-thumbnail.jpg) ![](https://spcdn.shortpixel.ai/spio/ret_img,q_cdnize,to_auto,s_webp:avif/covalent.com/wp-content/uploads/2025/02/tof-sims-webinar-thumbnail.jpg) # Unlock the Power of ToF-SIMS 2025-02-20 11:00:00 | 2026-05-24 22:57:42 February 20 2025, 11:00 am PT | 60 min In this episode, Dr. Tatyana Kravchuk and Dr. Lyle Gordon explain the operating principles and theory of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and demonstrate its broad applications in surface investigation across industries, including semiconductors, optical devices, paints, chemistry, and advanced materials. You will gain an understanding of how ToF-SIMS can resolve chemical compositions, molecular structures, and provide 3D depth profiling in both organic and inorganic materials. In addition, our experts will share case studies and practical tips to help you maximize the results of ToF-SIMS in your research and development efforts. ## Who should watch? This webinar has been designed for researchers and engineers looking to advance their knowledge and skills in surface and thin film analysis for product R&D. Anyone interested in learning more about modern surface characterization methods will benefit from the lecture. ## What You’ll Learn About ToF-SIMS: - How does this technique work? - What are its advantages and disadvantages? - What properties can it measure or help analyze? - What are some examples of ToF-SIMS applications in industry R&D? - What are the popular modes of operation? - Which samples and applications the technique is best suited for, and how should samples be prepared? ## About ToF-SIMS Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a highly sensitive surface analytical technique, well-established across many industrial and research applications. It provides detailed elemental and molecular information about surfaces, thin layers, interfaces, and enables full three-dimensional analysis of samples. Its use is widespread, including applications in semiconductors, polymers, paints, coatings, glass, paper, metals, ceramics, biomaterials, and pharmaceuticals. Speakers: Tatyana Kravchuk Member of Technical Staff, Covalent Dr. Kravchuk has recently joined Covalent Metrology as a SIMS specialist. She has over 20 years of experience in Surface Science, with a background in both academia and industry. She also has an extensive track of record in material research and development with a particular focus on batteries and semiconductors. Dr. Kravchuk completed her Bachelor, Master and PhD degrees in Physical Chemistry at the Technion – Isreal Institute of Technolgy Lyle Gordon Director of Materials, Chemistry and Surfaces Group, Covalent Dr. Gordon joined Covalent in 2023 where he manages the Materials, Chemistry and Surfaces group, overseeing X-ray metrology, analytical chemistry, and surface science. He has extensive expertise in time-of-flight mass spectrometry, particularly related to his work on atom probe tomography. 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