As semiconductor devices continue to shrink below 10 nm, preparing high-quality TEM samples has become increasingly challenging. Engineers need thinner lamellae, greater placement accuracy, lower preparation damage, and higher throughput to support today’s advanced failure analysis and process development workflows.
Join Covalent and Thermo Fisher Scientific for an in-depth look at the Helios 6 HD DualBeam™ system and its latest innovations in automated TEM sample preparation. Through real world examples, you’ll learn how advances in ion optics, imaging, stage performance, and AI-powered automation are helping laboratories produce more consistent, higher-quality TEM specimens while reducing operator intervention.
What You’ll Learn
- Overcome Modern TEM Preparation Challenges: how advanced FIB-SEM workflows improve lamella quality, placement accuracy, and preparation consistency for today’s semiconductor devices.
- Explore the Latest Helios 6 HD Innovations: how the Osprey ion column, enhanced imaging, precision stage control, and improved scan performance support higher-quality TEM sample preparation.
- Increase Productivity with AutoTEM 6: how AI-powered automation enables unattended sample preparation, reduces operator variability, and increases laboratory throughput.
- Improve Sample Quality Without Sacrificing Speed: practical strategies for preparing larger numbers of high-quality TEM samples while maintaining the precision required for advanced semiconductor analysis.
- Interpret Results More Confidently: how to recognize and minimize preparation artifacts — and what to look for when evaluating lamella quality for advanced node analysis.
Who Should Attend
- Failure analysis engineers
- Semiconductor process integration and process development engineers
- TEM and FIB-SEM users
- Materials characterization scientists
- Laboratory managers seeking higher-throughput automation
- Researchers working with advanced semiconductor devices
Operations Director of Electron Microscopy, Covalent
Product Marketing Manager, FIB-SEM, Thermo Fisher Scientific
