Webinars on Material Testing and Analysis

57 mins

Close-up of a microchip with detailed circuitry and glowing elements.

Apr 16, 2026

Beyond the Surface: Next-Generation Scanning Acoustic Microscopy

Scanning Acoustic Microscopy (SAM) is a powerful tool for non-destructive evaluation of internal features such as voids, delamination, and cracks but traditional systems have limitations in scale, geometry, and data interpretation.In this webinar, Covalent and PVA TePla will showcase how new advances in large-format scanning, rotational inspection, and machine learning are overcoming these challenges enabling…

58 mins

Feb 19, 2026

An Introduction to Fluorine NMR and its polymer applications

Nuclear magnetic resonance (NMR) is a powerful analytical technique which unveils the molecular structure by detecting the magnetic spins of a selected isotope. Fluorine-19 (19F) NMR is the primary characterization technique for fluorinated materials, which are widely used in advanced applications, such as energy storage, pharmaceuticals, semiconductors, and optical coatings. In this webinar, we will…

53 mins

Dec 4, 2025

Under the Microscope: Your Electron Microscopy Questions Answered

The session provides straightforward guidance for improving imaging workflows, selecting the right technique, preparing samples effectively, and interpreting complex microstructural and compositional features. This on-demand webinar gives you access to the full recording of our live session where experts addressed the most common and practical questions engineers and scientists encounter when using electron microscopy. Viewers…

53 mins

Oct 16, 2025

Unveiling the Nanoscale: PiFM for Chemical, Structural, and Surface Characterization

This presentation will illustrate how Photo-induced Force Microscopy (PiFM) can deliver unprecedented levels of chemical composition analysis, molecular binding environments, and surface topography, facilitating a more complete understanding of materials for a wide range of applications. Through hands-on examples, it will illustrate how Atomic Force Microscopy combined with Infrared Spectroscopy enables scientists to probe the…

53 mins

Aug 21, 2025

From Malfunction to Solution – Advanced Failure Analysis for Materials & Electronics

This webinar is planned to take you deep into today's highest-quality Failure Analysis (FA) techniques for diagnosing difficult challenges in electronics and advanced technologies. You will discover how tailored analysis plans and latest methods can effectively address even the toughest-to-solve failures by revealing root cause sources. Practical case studies showing the efficacy of this process…

53 mins

Jun 19, 2025

Tackling Miniaturization Challenges: High-Resolution Interface Analysis in Advanced Semiconductor Packaging

In this session, Dr. Naohiko Kawasaki from Toray Research Center (Japan) introduces powerful analytical techniques for investigating the chemical and physical properties of heterojunction interfaces in modern semiconductor devices. As microelectronic components become increasingly compact, understanding nanoscale interactions at bonding interfaces—such as those in 3D stacked structures and RDL (redistribution layer) interposers—is more important than…