Webinars on Material Testing and Analysis 8

60 mins

May 7, 2020

X-Ray Computed Tomography: The Superpower System

Welcome to the first episode released for Covalent Academy's Advancements in Instrumentation webinar series. This series will feature expert speakers from Covalent's corporate instrument partners, and will highlight the latest innovations in analytical technologies. This webinar is led by Rigaku Americas Corp.’s Director of X-ray Imaging, Aya Takase, who specializes in developing new analytical and…

60 mins

Apr 30, 2020

SEM/FIB DualBeam Microscopy: A Powerful Combination

Scanning electron microscopy is one of the fastest growing analytical techniques on the market. It allows analysts to investigate both surface and subsurface morphological features on a sub-micron scale, and is fundamental to the development and optimization of modern semiconductors, devices, thin films, and more. In this overview video, Covalent's Director of Scanning Electron Microscopy,…

60 mins

Apr 16, 2020

Stylus Profilometry / Atomic Force Microscopy (AFM) Techniques for High-Resolution Surface Metrology and Imaging: A User’s Guide

This Webinar will Answer: Frequently Asked Questions

60 mins

Apr 2, 2020

Optical Profilometry: Surface Roughness Characterization for Smooth Operators

Covalent's director of optical characterization, Dr. Matt Wong, breaks down four of the most tactical profilometry tools: Chromatic Dispersion Profilometry (CDP / FRT), Laser Scanning Confocal Microscopy (LSCM), White Light Interferometry (WLI), and Wide Area Patterned / Structured Light. He'll explain how images are generated on each system, and flag their unique benefits and limitations.…

60 mins

Mar 19, 2020

Surface Roughness 101: Which Technique Is Right for You?

Many people underestimate the impact that roughness has on a surface's functional properties. It can affect mechanical, chemical, optical, electrical, and even physical responses and material characteristics: for better or worse. In this webinar, you'll learn how to quanitfy and analyze surface roughness so you can ensure the optimal materials are incorporated into your next…

59 mins

Mar 18, 2020

Spectroscopic Ellipsometry: The Swiss Army Knife of Optical Metrology

View the inaugural presentation from Covalent Academy and learn about one of the most versatile optical characterization techniques available. Spectroscopic Ellipsometry ("SE" or "spectral ellipsometry") can be used to investigate a wide range of properties in advanced materials and coatings. Experts combine powerful modeling with raw optical parameters to extract measurements of surface roughness, crystal…