Read time

60 mins

Ep18_Thermo_FIB-SEM
Dec 10, 2020

Expert Lessons in Electron and Ion Beam Imaging and Interpretation

In this webinar recording, experts from Covalent Metrology and Thermo Fisher Scientific will discuss cutting-edge techniques and best practices for optimizing images captured with a FIB-SEM DualBeam microscope. Topics will include image interpretation, exploration of new state-of-the-art instrumentation, and the realm of analytical possibilities accessed using these techniques. This Webinar will Cover: DualBeam FIB-SEM: Combining…

Read time

60 mins

Ep17_Work-Function-v4
Oct 8, 2020

Work Function: Bridging the Gap Between Theory and Reality

Explore common misunderstandings about the work function of materials. This webinar recording dials in to the mainstream and modern techniques used to measure work function and sharing tactics to ensure you’re accessing the right information with these methods. Covalent speakers Roland Barbosa, PhD, and Chris Moore, PhD discuss both the theory and the practice behind…

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60 mins

Ep16_S-TEM-and-Talos
Sep 3, 2020

Scanning Transmission Electron Microscopy: Affordable Imaging and Analysis at Atomic Scale

Take an expert deep-dive into one of the most exciting characterization techniques available: (Scanning) Transmission Electron Microscopy (S/TEM) – the highest-resolution imaging technique in the world today. S/TEM is able to capture spatial features on the scale of individual atoms, and to map the elemental composition and morphology of complex nanomaterials and devices. These kinds…

Read time

56 mins

Ep15_SAM-with-PVA-TePla-Facebook
Aug 20, 2020

Seeing in Sound: Ultrasonic Imaging With Scanning Acoustic Microscopy

In this video installment of Covalent Academy’s Advancements in Instrumentation webinar miniseries, we put a finger to the pulse of innovations in Scanning Acoustic Microscopy (SAM). Guest speaker Lisa Logan from PVA TePla, a global leader in manufacturing acoustic microscopy systems, will describe how acoustic microscopy generates high-resolution 2D and 3D images, and will probe a selection of…

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60 mins

Ep15_SAM-with-PVA-TePla-Facebook
Aug 6, 2020

Shining a Light on Optical Modeling for Spectral Ellipsometry

Spectroscopic Ellipsometry is a powerful and highly sensitive metrology technique. However, unlocking its full potential requires more than collecting sound data. Nearly all results are only obtained after fitting optical models to the measurements; a sometimes-challenging process with significant repercussions for analytical accuracy. In this webinar recording, ellipsometry expert Dr. Max Junda, Senior Member of…

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60 mins

Ep12_XRR-v
Jul 9, 2020

(Thin Film) Reflections on X-Ray Reflectometry

This webinar recording will help you strengthen your knowledge on one of the most useful non-destructive thin film characterization tools available: X-Ray Reflectometry (XRR). This technique provides highly accurate layer thickness measurement as well as electron density and interfacial roughness information on single and multilayer thin film materials. This information can be equally useful in…