Skip to main content Skip to footer
Covalent
Login
Covalent
  • Services
    Services
    • Solutions
      Solutions
    • Applications
      Applications
  • Techniques
    Techniques
      • Electron Microscopy
        Electron Microscopy

        Atomic Resolution Electron Microscopy (AEM)

        Images atoms and maps composition, bonding, and strain.

        Differential Phase Contrast

        Visualize local electric fields at the nanoscale.

        Focused Ion Beam Scanning Electron Microscopy (FIB-SEM)

        Combines ion milling and electron imaging for nanoscale analysis.

        Nanoprobing

        Visualize local electric fields at the nanoscale.

        Precession Electron Diffraction (PED)

        PED is a TEM-based technique that rotates the electron beam for more precise crystallography at the nanoscale.

        Scanning Electron Microscopy (SEM) Analysis

        Images surface topography and composition with electrons.

        Scanning Transmission Electron Microscopy (STEM)

        Provides atomic-scale imaging and spectroscopic mapping.

        Transmission Electron Microscopy (TEM)

        Images atomic structure, defects, interfaces with sub-nm resolution.

      • Chemical Analysis
        Chemical analysis

        Attenuated Total Reflectance Fourier Transform Infrared Spectroscopy (ATR-FTIR)

        Rapid, non-destructive chemical identification.

        Auger Electron Spectroscopy (AES)

        Measures Auger electrons for high-resolution surface analysis.

        Dynamic Secondary Ion Mass Spectrometry (Dynamic SIMS)

        Quantifies elements and isotopes with nanometer depth profiling.

        Electron Probe Microanalysis (EPMA)

        Quantifies elemental composition at the micron scale.

        Energy Dispersive X-ray Fluorescence (EDXRF)

        Quick, non-destructive material composition & thickness analysis.

        Fourier Transform Infrared Spectroscopy (FTIR)

        Rapid, non-destructive molecular fingerprinting across materials.

        Gas Chromatography-Mass Spectrometry (GC-MS)

        Identifies and quantifies small organic molecules in mixtures.

        Gel Permeation Chromatography (GPC)

        Separates molecules by size to determine polymer properties.

        Glow Discharge Optical Emission Spectroscopy (GDOES)

        Sputters surfaces to quantify composition & depth-profile layers.

        Inductively Coupled Plasma Mass Spectrometry (ICP-MS)

        Measures trace elements with high accuracy.

        Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES)

        Quantifies multiple elements at very low concentrations.

        Ion Scattering Spectroscopy (ISS)

        Identifies elements in the outermost atomic layer.

        Nanoscale Secondary Ion Mass Spectrometry (NanoSIMS)

        Ultra-high-resolution elemental and isotopic imaging.

        Neutron Activation Analysis (NAA)

        Quantifies elements via gamma rays from irradiated samples.

        Nuclear Magnetic Resonance Spectroscopy (NMR)

        Determines molecular structure, composition, and dynamics.

        Photo-induced Force Microscopy (PiFM)

        Nanoscale chemical characterization & topography at sub-5nm.

        Raman Spectroscopy

        Measures inelastic photon scattering for chemical identification.

        Rutherford Backscattering Spectroscopy (RBS)

        Quantifies elemental composition and thin-film thickness.

        Time of Flight Secondary Ion Mass Spectroscopy (ToF-SIMS)

        Ultra-sensitive surface analysis with chemical imaging & depth profiling.

        Total Reflection X-ray Fluorescence (TXRF)

        TXRF is a surface sensitive elemental analysis technique used to determine the concentration of trace metal contamination on wafer surfaces.

        Ultraviolet Photoelectron Spectroscopy (UPS)

        Determines work function and valence electronic structure of surfaces.

        Ultraviolet Visible Near Infrared Spectrophotometry (UV-Vis-NIR)

        Measures absorbance, reflectance, and transmittance (175–3300 nm).

        Wavelength Dispersive X‑Ray Fluorescence (WDXRF)

        Non-destructive elemental composition & thin-film analysis.

        White Light Interferometry (WLI)

        Measures surface topography with sub-nanometer vertical resolution.

        X-ray Absorption Spectroscopy (XAS)

        Analyzes electronic structure of atoms and molecules.

        X-ray Diffraction (XRD)

        Non-destructive analysis of crystal phases, lattice, and strain.

        X-ray Photoelectron Spectroscopy (XPS)

        Measures surface elemental composition and chemical states.

      • Optical Analysis
        Optical analysis

        Attenuated Total Reflectance Fourier Transform Infrared Spectroscopy (ATR-FTIR)

        Rapid, non-destructive chemical identification.

        Cathodoluminescence (CL)

        Maps bandgap, defects, and strain with SEM correlation.

        Digital Optical Microscopy

        Rapid, high-resolution imaging of a sample.

        Dynamic Light Scattering (DLS)

        Quantifies particle size and uniformity in minutes.

        Fluorescence Microscopy

        Rapid, high-resolution imaging of a sample.

        Fourier Transform Infrared Spectroscopy (FTIR)

        Rapid, non-destructive molecular fingerprinting across materials.

        Infra-Red (IR) Thermography

        Visualizes surface temperatures to reveal defects & hotspots.

        Laser Scanning Confocal Microscopy (LSCM)

        Non-destructive 3D imaging of sample surfaces.

        Photo-induced Force Microscopy (PiFM)

        Nanoscale chemical characterization & topography at sub-5nm.

        Photoluminescence (PL) Spectroscopy

        Photoluminescence (PL) spectroscopy measures the luminescence spectrum emitted in response to optical excitation at a specified wavelength. Using a confocal microscope geometry, PL measurements can be performed with high spatial resolution.

        Raman Spectroscopy

        Measures inelastic photon scattering for chemical identification.

        SNOM-Raman

        Maps nanoscale stress and chemistry with 100 nm resolution.

        Spectroscopic Ellipsometry (SE)

        Measures thin-film thickness & optical properties.

        Structured Light Profilometry

        Creates precise 3D models without contact or damage.

        Ultraviolet Visible Near Infrared Spectrophotometry (UV-Vis-NIR)

        Measures absorbance, reflectance, and transmittance (175–3300 nm).

      • Mechanical Testing
        Mechanical Testing

        Capillary Flow Porometry (CFP)

        Characterizes through-pores in wettable, permeable materials.

        Dye & Pry Testing

        Reveals PCB solder joint cracks & defects.

        Dynamic Mechanical Analysis (DMA)

        Characterizes thermal and mechanical properties of soft materials.

        IPC Compliance Testing (IPC Compliance)

        Verifies IPC-A-610 quality to reduce defects.

        Mechanical Cross-Section Analysis (X-Section)

        Uncovers microstructures and defects causing performance issues.

        Nano-Scratch Test

        Measures lateral/frictional force between tip & sample.

        Nanoindentation

        Determines mechanical properties including hardness & modulus.

        Pendant Drop Surface Tension Measurement

        Provides accurate liquid property analysis for surface tension.

        Rheology

        Evaluates material behavior during processing, storage, and use.

        Tap Density

        Ratio of sample mass to volume after mechanical tapping.

        Tensile Testing

        Measures material behavior under axial stretching (tension).

        Thermomechanical Analysis (TMA)

        Measures material dimension changes with temp, time, or force.

      • Thermal Analysis
        Thermal Analysis

        Differential Scanning Calorimetry (DSC)

        Quantifies heat flow for material optimization.

        Dynamic Mechanical Analysis (DMA)

        Characterizes thermal and mechanical properties of soft materials.

        Infra-Red (IR) Thermography

        Visualizes surface temperatures to reveal defects & hotspots.

        Thermogravimetric Analysis (TGA)

        Measures material mass changes with temperature or time.

        Thermomechanical Analysis (TMA)

        Measures material dimension changes with temp, time, or force.

        Time-Domain Thermoreflectance (TDTR) Analysis

        Time-Domain Thermoreflectance (TDTR) is an optical pump–probe technique used to measure thermal conductivity, thermal boundary conductance, and heat transport properties in thin films deposited on solid substrates.

      • Morphology & Structural Analysis
        Morphology & Structural Analysis

        2D X-Ray Inspection

        Delivers clear internal views of complex electronics.

        Atomic Force Microscopy (AFM) Analysis

        Maps nanoscale topography and material properties with a sharp probe.

        Chromatic Confocal Profilometry & 3D Surface Profiling

        Fast, non-contact 3D surface measurements.

        Dynamic Light Scattering (DLS)

        Quantifies particle size and uniformity in minutes.

        Ellipsometric Porosimetry

        Ellipsometric porosimetry measures adsorption- and desorption-induced changes in optical properties to determine film porosity and pore size distribution in porous samples.

        Gas Adsorption Porosimetry

        Characterizes porous materials.

        Gas Pycnometry

        Fast, precise measurements of true volume, density, and porosity.

        Laser Diffraction Particle Size Analysis (LD-PSA)

        Analyzes particle sizes by measuring light scattering.

        Photo-induced Force Microscopy (PiFM)

        Nanoscale chemical characterization & topography at sub-5nm.

        Scanning Acoustic Microscopy (SAM)

        Locates internal flaws like cracks, voids, and delamination.

        Structured Light Profilometry

        Creates precise 3D models without contact or damage.

        X-ray Computed Tomography (Micro-CT)

        Non-contact, non-destructive 2D/3D images at micron scale.

        X-ray Diffraction (XRD)

        Non-destructive analysis of crystal phases, lattice, and strain.

        X-ray Reflectometry (XRR)

        Optimized scans tailored to each sample for best measurements.

        Zeta Potential

        Electric potential at the slipping plane of the EDL.

      • More Techniques
        More Techniques

        4-Point Probe (4PP) Measurement

        Measures sheet resistance and resistivity accurately.

        Scanning Capacitance Microscopy (SCM)

        Maps charge carrier polarity/distribution in semiconductors.

        Surface Free Energy (SFE)

        Quantitative insight into surface energy for adhesion and coatings.

        Water Contact Angle

        Quantitative insight into surface interactions affecting adhesion.

      • Explore All Techniques
    • Resources
      Resources
      • Webinars
        Webinars
        Tackling Miniaturization

        Tackling Miniaturization Challenges: High-Resolution Interface Analysis in Advanced Semiconductor Packaging

        In this session, Dr. Naohiko Kawasaki from Toray Research Center (Japan) introduces powerful analytical techniques for investigating the chemical…

        Watch Now
        Abstract colorful gradient wave 3d rendering, chromatic dispersion and thin film spectral effect. Chromatic. Illustration

        Precision in Thin Film Metrology: Techniques, Challenges, and Real-World Applications

        Join us for an exciting episode where we will dive deep into thin film measurement methods! Our experts, Dr.…

        Watch Now
      • Blogs
        Blogs
        Microplastics in Drinking Water Are Under EPA Scrutiny. How Do Labs Detect Them? 

        Microplastics in Drinking Water Are Under EPA Scrutiny. How Do Labs Detect Them? 

        Microplastics are no longer just an environmental buzzword. They are increasingly part of a public conversation about water quality, consumer safety, and…
        Explore
        Why Artemis’ Laser Communications Depend on Nanoscale Metrology

        Why Artemis’ Laser Communications Depend on Nanoscale Metrology

        This week we are all excited to witness the launch of Artemis II, the first crewed flight around the moon since 1972! …
        Explore
      • News
        News
        Default Banner

        Covalent Metrology Rebrands as Covalent to Reflect Expanded Capabilities and Focus on Material Insights

        Sunnyvale, California, Wednesday, August 14, 2025 - Covalent Metrology today announced it has rebranded as Covalent and launched a…

        Explore
        adobestock featured image

        Covalent Acquires Materials Characterization Services (MAT-CS), Expanding Its North-American Lab Partner Network

        Sunnyvale, Calif. – Thursday, August 21, 2025 – Covalent, a leading provider of advanced analytical and metrology services,…

        Explore
      • Library
        Library
        What’s Really in Our Sunscreens?

        What’s Really in Our Sunscreens?

        This case study reports a multi-technique characterization of two commercially available sunscreens—one mineral-based (TiO₂/ZnO) and one chemical-based—motivated by real-world…

        Explore
        Photoinduced Force Microscopy (PiFM) for Photonics Analysis

        Photoinduced Force Microscopy (PiFM) for Photonics Analysis

        In photonics fabrication, understanding how processing steps (deposition, doping, patterning) alter material chemistry and structure at small scales is…

        Explore
    • Company
      Company
      • About Us
        About Us
        About

        Covalent transforms complex material testing data into clear, actionable insights. From failure analysis to advanced compositional studies, we partner with innovators across industries to accelerate development and optimize performance.

        Learn more
      • Team
        Team

        We’re scientists, engineers, and problem-solvers first. Over 70% of us hold PhDs or advanced degrees. Every engagement is led by credentialed experts who combine deep technical knowledge with practical solutions tailored to your toughest challenges.

        Meet the team
      • Partners
        Partners

        Trusted by 1,500+ global manufacturers, OEMs, and R&D teams, Covalent builds long-term partnerships that deliver results at scale. Backed by $25M in tools and ISO-accredited methods, we focus on just one thing: data you can act on with confidence.

        Explore our partnerships
      • Careers
        Careers

        Join a team that's shaping the future of material insights. At Covalent, you'll work with world-class scientists, cutting-edge technology, and global industry leaders, all while making a measurable impact.

        View careers
      • Accreditations & Quality
        Accreditations & Quality

        Quality is foundational to our work. Covalent is ISO accredited and operates under a rigorous quality management system. Our processes, data, and results meet internationally recognized standards so you can trust every measurement and insight we deliver.

        Learn more
      • Covalent Core Lab
        Covalent Core Lab
        Technician operating advanced laboratory equipment at Covalent.
        A technician working with high-tech lab machinery in a clean, modern laboratory setting.

        The Covalent Core Lab provides advanced material characterization and analytical testing performed by Covalent scientists using state-of-the-art instrumentation to deliver fast, reliable results

        Learn more
      • Covalent Connect
        Covalent Connect
        Blockchain data network connecting labs, universities, and research institutions.
        Covalent's network links labs, universities, and research institutions for blockchain data sharing and collaboration.

        Covalent Connect provides access to specialized material characterization and testing services through a network of partner laboratories, guided by Covalent scientists for fast, reliable results.

        Learn more
    • Nexus Membership
    Contact Us
    Get a Quote
    Home/Webinars

    Webinar

    Explore expert-led webinars on failure analysis, interfaces, thin films, and more. Learn how leading R&D teams use advanced analytical techniques to solve real-world engineering problems.

    Read time

    60 mins

    Mar 24, 2022

    Advanced Analytical Scanning Transmission Electron Microscopy (STEM), and Future Directions

    There has been increasing demand for so-called ‘workhorse’-type transmission electron microscopes as the technologies and techniques in (scanning) transmission electron microscopy (S/TEM) have evolved. Researchers and engineers from diverse industries depend on the unparalleled spatial resolution of S/TEM imaging for key structural insight into novel nanomaterials and devices, spurring recent developments of more flexible, reliable…

    Read time

    60 mins

    Ep29-WDXRF-with-Rigaku
    Jan 27, 2022

    Adventures in Wavelength Dispersive X-Ray Fluorescence (WDXRF): Flexible Element Analysis for Thin Films and More

    While many materials scientists and engineers have heard about energy-dispersive x-ray spectroscopy techniques, fewer experts know about the unique advantages and applications of their sister technique, wavelength-dispersive x-ray fluorescence spectroscopy (WDXRF). Both methods measure elemental composition by analyzing the intensities of characteristic x-ray photons; however, WDXRF achieves higher peak resolution, fewer spectral interferences, and lower…

    Read time

    60 mins

    Dec 2, 2021

    Fast Characterization of Nanometer Thin to Thick Coatings Using Pulsed-RF Glow Discharge Optical Emission Spectrometry

    Glow Discharge Optical Emission Spectrometry (GDOES) is a flexible elemental analysis technique used to efficiently characterize both conductive and non-conductive materials and coatings. It combines high depth-precision and elemental sensitivity with one of the broadest detection ranges among any spectroscopic technique. This versatility, paired with the technique’s hallmark speed-to-data, makes it well suited for a…

    Read time

    60 mins

    Nov 11, 2021

    Modernizing Microscopy Methods: Capabilities and Applications of TEM/STEM Systems

    Modern (scanning) transmission electron microscopy (S/TEM) tools, like the Talos F200X system at Covalent, are outfitted with technologies that allow analysts to craft an optimum imaging session for the unique needs of each client project. In this webinar event, guest speaker Dr. Jan Ringnalda from Thermo Fisher Scientific will be exploring both basic and advanced…

    Read time

    60 mins

    Oct 21, 2021

    Upgrading Metrology Services With Mountains™ 9: Improved Automation, Visualization, and Analysis

    The best dataset in the world would be useless without the right tools for data processing, statistical analysis, and visualization. Join in the live event to experience a real-time demonstration of Covalent’s powerful new capabilities enabled by Digital Surf’s new Mountains™ 9 software package and get a glimpse of how this suite of tools can…

    Read time

    60 mins

    Ep25 PorometryPorosimetry Pycnometry BannerV2 zoom scaled
    Oct 7, 2021

    Porometry, Porosimetry, and Pycnometry: The 3 P’s You Need for Porous Materials Characterization

    Membranes and porous materials integrated in everything from personal protective equipment (PPE) to industrial concrete are often misunderstood. In many cases, scientists and engineers working with such substrates may not realize how affordably and robustly they can be characterized. In this webinar event, Dr. Nanette Jarenwattananon will break down the fundamentals of 3 of the…

    • 1
    • 2
    • 3
    • 4
    • 5
    • 6
    • …
    • 8
    Subscribe to Our Newsletter

    Subscribe to our newsletter for the latest updates, insights, and breakthroughs - delivered straight to your inbox.

    Covalent

    From specific techniques to complex problem-solving, our platform delivers expert-driven insights.

    Services by Solutions

    • Failure Analysis
    • Compositional Analysis
    • Metrology Consulting Services
    • Quality Control Testing
    • Metallurgical Analysis
    • Material Verification
    • Contamination Analysis
    • Performance Optimization

    Services by Applications

    • Optical Characterization
    • Surface Analysis & Interface
    • Mechanical Testing
    • Polymer & Plastic Analysis
    • Powder Analysis Testing
    • Chemical Compositional Analysis
    • Metals Testing & Failure Analysis
    • Coating Testing

    Resources

    • Webinars
    • Blogs
    • News
    • Library

    Company

    • About us
    • Team
    • Partners
    • Careers
    • Accreditations & Quality
    • Covalent Core Lab
    • Covalent Connect

    Electron Microscopy

    • Scanning Electron Microscopy (SEM)
    • Transmission Electron Microscopy (TEM)
    • Scanning TEM (STEM)
    • FIB-SEM
    • Atomic Resolution EM
    • Nanoprobing
    • Precession Electron Diffraction
    • Differential Phase Contrast

    Chemical Analysis

    • X-Ray Photoelectron Spectroscopy
    • Auger Electron Spectroscopy
    • ToF-SIMS
    • Dynamic SIMS
    • FTIR
    • GC-MS
    • ICP-OES
    • ICP-MS

    Optical Analysis

    • Raman Spectroscopy
    • Spectroscopic Ellipsometry
    • Fluorescence Microscopy
    • UV-Vis-NIR Spectrophotometry
    • Laser Scanning Confocal Microscopy
    • Cathodoluminescence Imaging
    • SNOM Raman
    • Digital Optical Microscopy

    Mechanical Testing

    • Tensile Testing
    • Nanoindentation
    • Rheology
    • Dynamic Mechanical Analysis
    • IPC Compliance Testing
    • Capillary Flow Porometry
    • Nano Scratch Testing
    • Mechanical Cross-Section Analysis

    Thermal Analysis

    • Differential Scanning Calorimetry
    • Thermogravimetric Analysis
    • Thermomechanical Analysis
    • Infrared IR Thermography
    • Time-Domain Thermoreflectance

    Morphology & Structural Analysis

    • Atomic Force Microscopy
    • X-Ray Diffraction
    • Micro-X-Ray Computed Tomography
    • Scanning Acoustic Microscopy
    • 2D X-Ray Inspection
    • Laser Diffraction Particle Size
    • Dynamic Light Scattering
    • Gas Adsorption Porosimetry

    More Techniques

    • 4 Point Probe Measurement
    • Surface Free Energy Measurement
    • Water Contact Angle Measurement

    Contact Information

    • +1 408-580-0605
    • hello@covalent.com
    • 925 Thompson Pl
      Sunnyvale, CA, 94085
    Cookie & Tracking Choices Do Not Sell My Personal Information Privacy Policy Terms and Conditions

    Copyright Covalent Corp. 2026. All Rights Reserved.