Webinars on Material Testing and Analysis 2

53 mins

Aug 21, 2025

From Malfunction to Solution – Advanced Failure Analysis for Materials & Electronics

This webinar is planned to take you deep into today's highest-quality Failure Analysis (FA) techniques for diagnosing difficult challenges in electronics and advanced technologies. You will discover how tailored analysis plans and latest methods can effectively address even the toughest-to-solve failures by revealing root cause sources. Practical case studies showing the efficacy of this process…

53 mins

Jun 19, 2025

Tackling Miniaturization Challenges: High-Resolution Interface Analysis in Advanced Semiconductor Packaging

In this session, Dr. Naohiko Kawasaki from Toray Research Center (Japan) introduces powerful analytical techniques for investigating the chemical and physical properties of heterojunction interfaces in modern semiconductor devices. As microelectronic components become increasingly compact, understanding nanoscale interactions at bonding interfaces—such as those in 3D stacked structures and RDL (redistribution layer) interposers—is more important than…

60 mins

Abstract colorful gradient wave 3d rendering, chromatic dispersion and thin film spectral effect. Chromatic. Illustration

Apr 10, 2025

Precision in Thin Film Metrology: Techniques, Challenges, and Real-World Applications

Join us for an exciting episode where we will dive deep into thin film measurement methods! Our experts, Dr. Lyle Gordon and Dr. Max Junda, are ready to share their knowledge with you. In this engaging webinar, you'll learn about the different techniques used in thin film metrology and how they are applied in various…

60 mins

Feb 20, 2025

Unlock the Power of ToF-SIMS

In this episode, Dr. Tatyana Kravchuk and Dr. Lyle Gordon explain the operating principles and theory of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and demonstrate its broad applications in surface investigation across industries, including semiconductors, optical devices, paints, chemistry, and advanced materials. You will gain an understanding of how ToF-SIMS can resolve chemical compositions, molecular…

60 mins

Spectroscopic Ellipsometry Webinar Thumbnail

Oct 17, 2024

R&D Applications of Spectroscopic Ellipsometry

In this episode, Dr. Jianing Sun (from J.A. Woollam) explains the operating principles and theory of Spectroscopic Ellipsometry before demonstrating its broad applications in thin film research and development across industries including semiconductors, displays, optical devices, photovoltaics, biotechnology, chemistry, and advanced materials. This webinar introduces an increasingly powerful and fast-growing optical technique for thin-film characterization: Spectroscopic…

60 mins

Dynamic Nanoindentation Webinar Thumbnail

Jul 18, 2024

Pressing Ahead: Unveiling Material Insights Through Dynamic Nanoindentation

Nano-indentation is a powerful surface characterization technique used to probe the mechanical properties of materials. In this webinar, learn how new, dynamic nano-indentation methods are unlocking more advanced measurements such as viscoelastic properties, stress / strain, and continuous depth profiling. You’ll Learn: Dynamic Indentation Facilitates Deeper Insights Nano-indentation has long been an ideal method for mechanical testing…