About this webinar
Organic contamination is a persistent challenge across industries, especially when particles are small, embedded, or hard to isolate. This webinar introduces a combined focused ion beam–scanning electron microscopy (FIB-SEM) and Fourier-transform infrared (FTIR) microscopy workflow for precise isolation and reliable identification of organic contaminants.
By pairing targeted sample extraction with molecular analysis, this approach gives a more complete picture of foreign materials that a single technique can miss. FIB-SEM pinpoints and extracts the defect; FTIR identifies what it is.
Attendees will see how the workflow supports failure analysis and foreign material identification, with application examples from pharmaceutical manufacturing and semiconductor contamination analysis, where fast, accurate identification is critical for product quality, safety, and regulatory compliance. The session ends with a live Q&A with Covalent and Thermo Fisher Scientific experts.
This Webinar Is Best For
- Failure analysis scientists and engineers
- QA/QC and quality assurance professionals
- Pharmaceutical R&D and manufacturing scientists
- Semiconductor process, yield, and contamination engineers
- Analytical scientists working in materials characterization or contamination analysis
- Academic and applied researchers (e.g., microplastics, materials science, life sciences)
What You’ll Learn
- How FIB-SEM and FTIR microscopy work and how they complement each other
- A practical workflow for isolating and identifying organic microparticles
- FIB extraction techniques, including milling and lift-out of targeted regions
- FTIR microscopy approaches for analyzing small or embedded particles
- Application insights from pharmaceutical, semiconductor, and failure analysis investigations, with time for your questions in the live Q&A
