April 25, 2022
These videos are excerpted from a Covalent Academy webinar episode presented by Ryan Dudschus, a Senior Metrology Engineer in Covalent’s electron microscopy group. His webinar presentation explains the preparation techniques used to extract high-quality lamella for (scanning) transmission electron microscopy analysis.
Videos in the Library:
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A Variety of Key Lamella Liftout Methods
Avoiding Common Types of Lamella Defects Caused by the Focused Ion Beam
Milling Rates and Overtilt
Overview of STEM Lamella Preparation
The Impact of Lamella Thinness on Imaging
