What Is Chemical Analysis?
Chemical Analysis is straightforward in principle but complicated in practice – at its heart, it is attempting to identify what elements or compounds are present in a given sample that are causing it to behave (or not behave) in a specific way. In the material testing world, chemical testing can help with analyzing materials for contamination, understanding degradation patterns, informing specific failure analysis, and more.
Chemical analysis is often combined with mechanical analysis to help scientists understand the ‘why’ behind the results of material analysis, not just the ‘what’ – for example, if you find that a material fatigues too quickly as a result of a mechanical analysis, chemical analysis can inform an understanding of why.
Covalent’s chemical testing services allow for analyzing polymers, verifying the composition of thin films and coatings, trace element analysis, and more.
How It Works
Covalent’s chemical testing laboratory is often called on to verify purity of material, detect contaminants that affect the performance of a material, or optimize formulations early in the product development process.
Various types of chemical analysis are suited to specific applications. Spectroscopy techniques provide information on chemical bonding, structure and surface information and can detect trace elements with astounding precision. Chromatography is about separating complex mixtures into their components, to identify concentrations of specific elements.
The field’s breadth is one of its greatest strengths – whether your sample consists of organic or inorganic compounds, volatile or stable, solid, liquid, or gas, Covalent’s scientists can help you identify the appropriate method. Expertise is required to translate the existence (or absence) of a chemical at a given level into operational insight.

Techniques Used in Chemical Analysis
Attenuated Total Reflectance Fourier Transform Infrared Spectroscopy (ATR-FTIR)
Rapid, non-destructive chemical identification. Explore
Auger Electron Spectroscopy (AES)
Measures Auger electrons for high-resolution surface analysis. Explore
Dynamic Secondary Ion Mass Spectrometry (Dynamic SIMS)
Quantifies elements and isotopes with nanometer depth profiling. Explore
Electron Probe Microanalysis (EPMA)
Quantifies elemental composition at the micron scale. Explore
Energy Dispersive X-ray Fluorescence (EDXRF)
Quick, non-destructive material composition & thickness analysis. Explore
Fourier Transform Infrared Spectroscopy (FTIR)
Rapid, non-destructive molecular fingerprinting across materials. Explore
Gas Chromatography-Mass Spectrometry (GC-MS)
Identifies and quantifies small organic molecules in mixtures. Explore
Gel Permeation Chromatography (GPC)
Separates molecules by size to determine polymer properties. Explore
Glow Discharge Optical Emission Spectroscopy (GDOES)
Sputters surfaces to quantify composition & depth-profile layers. Explore
Inductively Coupled Plasma Mass Spectrometry (ICP-MS)
Measures trace elements with high accuracy. Explore
Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES)
Quantifies multiple elements at very low concentrations. Explore
Ion Scattering Spectroscopy (ISS)
Identifies elements in the outermost atomic layer. Explore
Nanoscale Secondary Ion Mass Spectrometry (NanoSIMS)
Ultra-high-resolution elemental and isotopic imaging. Explore
Neutron Activation Analysis (NAA)
Quantifies elements via gamma rays from irradiated samples. Explore
Nuclear Magnetic Resonance Spectroscopy (NMR)
Determines molecular structure, composition, and dynamics. Explore
Photo-induced Force Microscopy (PiFM)
Nanoscale chemical characterization & topography at sub-5nm. Explore
Raman Spectroscopy
Measures inelastic photon scattering for chemical identification. Explore
Rutherford Backscattering Spectroscopy (RBS)
Quantifies elemental composition and thin-film thickness. Explore
Time of Flight Secondary Ion Mass Spectroscopy (ToF-SIMS)
Ultra-sensitive surface analysis with chemical imaging & depth profiling. Explore
Ultraviolet Photoelectron Spectroscopy (UPS)
Determines work function and valence electronic structure of surfaces. Explore
Ultraviolet Visible Near Infrared Spectrophotometry (UV-Vis-NIR)
Measures absorbance, reflectance, and transmittance (175–3300 nm). Explore
Wavelength Dispersive X‑Ray Fluorescence (WDXRF)
Non-destructive elemental composition & thin-film analysis. Explore
White Light Interferometry (WLI)
Measures surface topography with sub-nanometer vertical resolution. Explore
X-ray Absorption Spectroscopy (XAS)
Analyzes electronic structure of atoms and molecules. Explore
X-ray Diffraction (XRD)
Non-destructive analysis of crystal phases, lattice, and strain. Explore
X-ray Photoelectron Spectroscopy (XPS)
Measures surface elemental composition and chemical states. Explore