Morphology and Structural Analysis

How Morphology and Structural Analysis Works

We align our methods with your decision points, selecting the most rigorous and defensible route to a reliable answer. Each analysis is designed to generate data that can be directly correlated with engineering performance and qualification criteria.

• Surfaces: Sub-nanometer vertical sensitivity on micrometer fields, stitched optical or interferometric maps up to centimeter scale; outputs include roughness parameters (Sa, Sq, Sz, Ssk, Sku), autocorrelation length, bearing ratio, and anisotropy; these are predictors for adhesion, sealability, early fatigue initiation sites, or optical scatter.
• Porosity: Quantifies specific surface area, micro and mesopore size distributions, bubble point, through-pore connectivity, and skeletal versus envelope density to isolate open and closed porosity; these reveal flow resistance, tortuosity, and storage capacity, which directly parameterize permeability or diffusion models.
• Structure: Identifies and quantifies crystal phases (Rietveld refinement), texture (pole figures and orientation indices), microstrain, and residual stress; thin-film stack fitting yields layer thickness, density, and interfacial roughness, and can be cross-validated with AFM step or roughness or ellipsometry where appropriate. All results can be provided with NIST-traceable references, method uncertainty, and cross-technique verification for QA and audit readiness.