Jul 21 2021, 6:00 am
Recent innovations have made scanning probe microscopy (SPM) a hugely flexible and powerful technique for analyzing surface topography and material properties. Covalent experts rely on a combination of cutting-edge instrumentation and advanced software tools for data analysis to provide actionable, accurate insights in presentation-ready reports. The SPM team can accelerate your research and development work by making metrology partnership easy and efficient, with impactful data delivered at fast and reliable turnaround times.
