May 02 2021, 6:00 am
Covalent expert team of S/TEM analysts assembled this eBrief to debunk 7 of the most common misunderstandings about modern S/TEM capabilities and applications. They break down some of the origins of these myths and explain why modern-day S/TEM characterization is growing in popularity and solving metrology challenges in new areas of research and engineering.
S/TEM techniques and the powerful insights they unlock have never been so approachable and affordable! Make sure you avoid these 7 Myths and set yourself up for success if S/TEM analysis could accelerate your next engineering project.
Learn More About S/TEM:
Transmission Electron Microscopy (TEM)
Scanning Transmission Electron Microscopy (STEM)
Read the Blog: Covalent Busts 7 Common Myths about Modern TEM
