Techniques
High‑resolution material data from the right techniques, applied by experts who know what it means for your product.
Measures sheet resistance and resistivity accurately. Explore
Maps nanoscale topography and material properties with a sharp probe. Explore
Images atoms and maps composition, bonding, and strain. Explore
Rapid, non-destructive chemical identification. Explore
Measures Auger electrons for high-resolution surface analysis. Explore
Characterizes through-pores in wettable, permeable materials. Explore
Maps bandgap, defects, and strain with SEM correlation. Explore
Fast, non-contact 3D surface measurements. Explore
Quantifies heat flow for material optimization. Explore
Quantifies particle size and uniformity in minutes. Explore
Characterizes thermal and mechanical properties of soft materials. Explore
Quantifies elements and isotopes with nanometer depth profiling. Explore
Quantifies elemental composition at the micron scale. Explore
Quick, non-destructive material composition & thickness analysis. Explore
Combines ion milling and electron imaging for nanoscale analysis. Explore
Rapid, non-destructive molecular fingerprinting across materials. Explore
Identifies and quantifies small organic molecules in mixtures. Explore
Fast, precise measurements of true volume, density, and porosity. Explore
Separates molecules by size to determine polymer properties. Explore
Sputters surfaces to quantify composition & depth-profile layers. Explore
Measures trace elements with high accuracy. Explore
Quantifies multiple elements at very low concentrations. Explore
Visualizes surface temperatures to reveal defects & hotspots. Explore
Identifies elements in the outermost atomic layer. Explore
Verifies IPC-A-610 quality to reduce defects. Explore
Analyzes particle sizes by measuring light scattering. Explore
Non-destructive 3D imaging of sample surfaces. Explore
Uncovers microstructures and defects causing performance issues. Explore
Ultra-high-resolution elemental and isotopic imaging. Explore
Quantifies elements via gamma rays from irradiated samples. Explore
Determines molecular structure, composition, and dynamics. Explore
Provides accurate liquid property analysis for surface tension. Explore
Nanoscale chemical characterization & topography at sub-5nm. Explore
PED is a TEM-based technique that rotates the electron beam for more precise crystallography at the nanoscale. Explore
Measures inelastic photon scattering for chemical identification. Explore
Quantifies elemental composition and thin-film thickness. Explore
Locates internal flaws like cracks, voids, and delamination. Explore
Maps charge carrier polarity/distribution in semiconductors. Explore
Images surface topography and composition with electrons. Explore
Provides atomic-scale imaging and spectroscopic mapping. Explore
Measures thin-film thickness & optical properties. Explore
Creates precise 3D models without contact or damage. Explore
Quantitative insight into surface energy for adhesion and coatings. Explore
Measures material mass changes with temperature or time. Explore
Measures material dimension changes with temp, time, or force. Explore
Ultra-sensitive surface analysis with chemical imaging & depth profiling. Explore
TXRF is a surface sensitive elemental analysis technique used to determine the concentration of trace metal contamination on wafer surfaces. Explore
Images atomic structure, defects, interfaces with sub-nm resolution. Explore
Determines work function and valence electronic structure of surfaces. Explore
Measures absorbance, reflectance, and transmittance (175–3300 nm). Explore
Quantitative insight into surface interactions affecting adhesion. Explore
Non-destructive elemental composition & thin-film analysis. Explore
Measures surface topography with sub-nanometer vertical resolution. Explore
Analyzes electronic structure of atoms and molecules. Explore
Non-contact, non-destructive 2D/3D images at micron scale. Explore
Non-destructive analysis of crystal phases, lattice, and strain. Explore
Measures surface elemental composition and chemical states. Explore
Optimized scans tailored to each sample for best measurements. Explore
