Scanning Electron Microscopes (SEM) are powerful instruments that can produce, collect, and analyze a variety of signals -all of which have different strengths. Understanding and optimizing SEM signals allows researchers to refine their analysis techniques and collect data targeted towards their research goals.
The SEM Analysis team at Covalent has assembled this datasheet to aid researchers in better understanding and optimizing their SEM signals. In this datasheet, the team touches on the sourcing, strengths, and analysis of backscattered electrons (BSE), secondary electrons (SE), and X-ray emissions and provides considerations for planning an SEM experiment.