Covalent

Composition and Density Analysis in OLED Devices Using Micro-RBS

This white paper summarizes how Rutherford Backscattering Spectroscopy (RBS) is used to analyze the composition and density of OLED devices.

Toray Research Center possesses the world's first introduced high-spatial-resolution RBS system. Accurate composition and density evaluation of a small area can be realized by using a high-energy micro-ion-beam. The composition and density analysis of the IGZO layer in the flexible OLED device and Ir quantification in the emission layer are shown in this white paper.