STEM-CL is an analytical tool which is similar to well-known techniques: SEM-CL, PL, and EELS. We developed new STEM-CL apparatus. In this work, we introduce crystalline quality to GaN flakes and ZnO nanowires by STEM-CL.
Crystalline Characterization of ZnO Nanowire and GaN Flake Using STEM-CL
In this work, Toray Research Center introduces crystalline quality to GaN flakes and ZnO nanowires by STEM-CL.