Crystalline Characterization of ZnO Nanowire and GaN Flake Using STEM-CL
Dec 12, 2021
STEM-CL is an analytical tool which is similar to well-known techniques: SEM-CL, PL, and EELS. We developed new STEM-CL apparatus. In this work, we introduce crystalline quality to GaN flakes and ZnO nanowires by STEM-CL.